Thrust Washer Defect Test Block Eddy Current Array Testing

2026-01-13 14:34 ytzx









Thrust Washer Defect Test Block Eddy Current Array Testing







Test Location: Company Laboratory

Test Block Type: Thrust Washer Test Block
Inspector: Tian Liqiang
January 8, 2026




     
To accurately identify defects in thrust washer test blocks and verify the applicability of eddy current array testing technology for such workpieces, a special test was carried out in the company’s laboratory.
The test was conducted by Tian Liqiang. On January 8, 2026, the thrust washer test blocks mailed to the laboratory were numbered and marked, after which eddy current testing was performed on each numbered test block one by one using an MEA-128 eddy current array tester and an ultra-flexible array probe.
This test is intended to determine the location and distribution of defects in the test blocks as well as the adaptability of the testing equipment, so as to provide data support for subsequent defect evaluation and optimization of testing schemes.

The selection of test equipment and probes, together with the analysis of specific test results, is presented below.



Equipment, Probes and Test Blocks Used in This Test

Numbering and marking of the mailed test blocks



thrust washer


The equipment used in this test is the MEA-128 eddy current array testing instrument


Ultra-flexible Array Probe


Test Result Analysis

1#The defects on the test block are located in a narrow area, which is not suitable for array probes. It is recommended to use a dedicated pencil probe.



2#The engineer detected one defect on the test block, as indicated by the red mark in the figure below


图片1.png


Inspection Result Image

(The two signals in the C-scan image are from duplicate scanning)


3#The engineer identified one defect on the test block, as marked in red in the figure below




Inspection Result Image

(Two signals shown in the C-scan are from repeated scanning)

The engineer identified one defect on the test block, as marked in red in the figure below



Inspection Result Image

(Two signals in the C-scan are caused by repeated scanning)



5#The defect on the test block is located in a narrow space, making it unsuitable for array probes. A dedicated pencil probe is recommended.


6#The engineer identified one defect on the test block at the position marked in red in the figure below



Inspection Result Image

(Two signals displayed in the C-scan are due to repeated scanning)



7#The engineer identified one defect on the test block, as shown at the red-marked position in the figure below.




Inspection Result Image

(Two signals in the C-scan are from repeated scanning)


推文置低.png



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